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- 產(chǎn)品名稱:HLP-01,試驗(yàn)探棒
- 產(chǎn)品型號(hào):試驗(yàn)探棒
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簡(jiǎn)單介紹
HLP-01,試驗(yàn)探棒 符合:IEC1010,EN61010-1, UL3101-1,CSA 1010-1標(biāo)準(zhǔn)(品牌:美國(guó).ED&D).TFP-01,Test Finger Probe (IEC試驗(yàn)指),符合: IEC, EN,CSA,UL標(biāo)準(zhǔn)
產(chǎn)品描述
HLP-01,試驗(yàn)探棒
TFP-01,Test Finger Probe (IEC試驗(yàn)指),符合: IEC, EN,CSA,UL標(biāo)準(zhǔn).(品牌:美國(guó).ED&D) ULP-02,Articulated Probe with Discs(關(guān)節(jié)試驗(yàn)指),符合UL標(biāo)準(zhǔn).(品牌:美國(guó).ED&D) ULP-02,Articulated Probe with Discs(UL關(guān)節(jié)試驗(yàn)指)
ACCESSIBILITY PROBES 試驗(yàn)探針 |
FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS Model HLP-01: 4.0mm Hazardous Live Parts Probe(試驗(yàn)探棒) | Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin. The rod is made of stainless steel. |
美國(guó).ED&D產(chǎn)品服務(wù)于:IBM ,美國(guó)航空暨太空總署,英代爾,蘋果, NCR ,索尼公司,太陽(yáng),飛利浦公司,思科, AT&T , Compaq , JVC , Hewlett-Packard ,摩托羅拉, Mattel ,戴爾,3 Com 等公司;專為UL , CSA , ETL , TUV,Demko等試驗(yàn)室提供檢測(cè)產(chǎn)品. |